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Scherrer formula and Williamson-Hall plot or WH-plot are the common methods to
determine microstructure information from diffraction pattern, a technique with the expenses of
the physical meaning of the result. Eventually a Whole Powder Pattern Modeling (WPPM) has
been proposed, allowing physical information to be extracted from the diffraction data with the
one-step refinement of the experimental pattern. In this paper, we reported the comparison
between Williamson-Hall plot and Whole Powder Pattern Modeling to determine the crystallite
size of nanoparticle barium hexaferrites which prepared by mechanical alloying and direct
ultrasonic destruction.